Investigations of heterogeneous ultrathin blends using lateral force microscopy
نویسندگان
چکیده
منابع مشابه
Lateral Manipulation of Single Atoms Using Atomic Force Microscopy
Engineering nanostructures on different surfaces by manipulating single atoms and molecules is an ultimate target in nanotechnology. Since the first time that atoms were individually arranged on a surface [1], the technique has reached a level in which it is possible to build a logic gate based on few molecules [2] or to set the initial stage of wiring a molecule [3]. Most of these impressive e...
متن کاملLateral force microscopy of multiwalled carbon nanotubes.
Carbon nanotubes are usually imaged with the atomic force microscope (AFM) in non-contact mode. However, in many applications, such as mechanical manipulation or elasticity measurements, contact mode is used. The forces affecting the nanotube are then considerable and not fully understood. In this work lateral forces were measured during contact mode imaging with an AFM across a carbon nanotube...
متن کاملMagnetic force microscopy using fabricated cobalt-coated carbon nanotubes probes
Magnetic force microscope ( MFM ) is a powerful technique for mapping the magnetic force gradient above the sample surface. Herein, single-wall carbon nanotubes (SWCNT) were used to fabricate MFM probe by dielectrophoresis method which is a reproducible and cost-effective technique. The effect of induced voltage on the deposition manner of carbon nanotubes (CNT) on the atomic force microscope (...
متن کاملUltrathin topological insulator Bi2Se3 nanoribbons exfoliated by atomic force microscopy.
Ultrathin topological insulator nanostructures, in which coupling between top and bottom surface states takes place, are of great intellectual and practical importance. Due to the weak van der Waals interaction between adjacent quintuple layers (QLs), the layered bismuth selenide (Bi(2)Se(3)), a single Dirac-cone topological insulator with a large bulk gap, can be exfoliated down to a few QLs. ...
متن کاملIn Situ Probing the Relaxation Properties of Ultrathin Polystyrene Films by Using Electric Force Microscopy
The rapid development of nanoscience and nanotechnology involves polymer films with thickness down to nanometer scale. However, the properties of ultrathin polymer films are extremely different from that of bulk matrix or thin films. It is challenging to distinguish the changes of physical properties in ultrathin films using conventional techniques especially when it locates near the glass tran...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Macromolecular Symposia
سال: 2001
ISSN: 1022-1360,1521-3900
DOI: 10.1002/1521-3900(200103)167:1<201::aid-masy201>3.0.co;2-p